LUCA, Dumitru; APETREI, Radu; DOBROMIR, Marius; DASCALEANU, Vasile; TEODORESCU, Cristian-Mihail. An XPS study of RF sputtered Ti1-xFexO2 thin films. Journal of Automation, Mobile Robotics and Intelligent Systems, [S. l.], v. 3, n. 4, p. 15–17, 2013. Disponível em: https://jamris.d.tomp.pl/index.php/JAMRIS/article/view/34. Acesso em: 17 jul. 2025.