Salleh, F., Asai, K., Ischida, A., & Ikeda, H. (2013). Impurity-concentration dependence of seebeck coefficient in silicon-on-insulator layers. Journal of Automation, Mobile Robotics and Intelligent Systems, 3(4), 134-136. https://jamris.d.tomp.pl/index.php/JAMRIS/article/view/68